Deep submicron technology enabled the design of the industry's first very large chips. The magnitude of the design effort involved in creating these chips led to the adoption of reuse methodologies ...
The most effective way to shorten test times is to test more of the SOC IP (intellectual-property) cores in parallel. However, for best results, the SOC design should anticipate parallel testing, and ...
Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
T2000 AiR2X air-cooled SoC and power analog test solution · GlobeNewswire Inc. TOKYO, Dec. 11, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) ...
Japan's Advantest has announced an acceleration of its capacity expansion plans for system-on-chip (SoC) test equipment in response to surging demand driven by artificial intelligence (AI) hardware ...
TOKYO, Sept. 23, 2020 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced its next-generation V93000 testers targeted at advanced digital ...
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